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Probe for physical properties measurement
A Standard patent application filed on 27 October 2003 credited to Shinyashiki, Naoki ; Inoue, Toshifumi ; Yagihara, Shin
Details
Application number :
2003275680
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Probe for physical properties measurement
Inventor :
Shinyashiki, Naoki ; Inoue, Toshifumi ; Yagihara, Shin
Agent name :
Address for service :
Filing date :
27 October 2003
Associated companies :
Applicant name :
NICHIREI CORPORATION
Applicant address :
19-20, Tsukiji 6-chome, Chuo-ku, Tokyo 104-8402
Old name :
Original Source :
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