Semiconductor testing instrument to determine safe operating area
A Standard patent application filed on 13 October 2003 credited to Ladbrooke, Peter ; Goodship, Neil

Details

Application number :

2003271965  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Semiconductor testing instrument to determine safe operating area  

Inventor :

Ladbrooke, Peter ; Goodship, Neil  

Agent name :

 

Address for service :

 

Filing date :

13 October 2003  

Associated companies :

 

Applicant name :

AOTI OPERATING COMPANY, INC.  

Applicant address :

131 NW Hawthorne Avenue, Suite 207, Bend, OR 97701  

Old name :

 

Original Source :

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Same Inventor

• Semiconductor monitoring instrument