Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (spm) reading
A Standard patent application filed on 05 September 2003 credited to Yamakawa, Mineo
;
Su, Xing
;
Chan, Selena
Details
Application number :
2003270398
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (spm) reading
Inventor :
Yamakawa, Mineo
;
Su, Xing
;
Chan, Selena
Agent name :
Address for service :
Filing date :
05 September 2003
Associated companies :
Applicant name :
INTEL CORPORATION
Applicant address :
2200 Mission College Boulevard, Santa Clara, CA 95052