Printed circuit board inspection system combining x-ray inspection and visual inspection
A Standard patent application filed on 14 October 2003 credited to Lee, Dong-Hyun ; Hong, Seong-Cheol ; Kim, Jong-Won

Details

Application number :

2003269535  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Printed circuit board inspection system combining x-ray inspection and visual inspection  

Inventor :

Lee, Dong-Hyun ; Hong, Seong-Cheol ; Kim, Jong-Won  

Agent name :

 

Address for service :

 

Filing date :

14 October 2003  

Associated companies :

 

Applicant name :

MIRTEC CO., LTD.  

Applicant address :

4F., Cheongmyung Towntell, 1021-4, Yongtong-dong, Paldal-gu, Suwon-city, 442-813 Gyeonggi-do  

Old name :

 

Original Source :

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