Methods for measuring column nonuniformity in a projection display system
A Standard patent application filed on 08 August 2003 credited to Keith, David L.
;
Linn, Steven H.
;
Odom, Philip
;
Goetz, Howard V.
Details
Application number :
2003264026
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Methods for measuring column nonuniformity in a projection display system
Inventor :
Keith, David L.
;
Linn, Steven H.
;
Odom, Philip
;
Goetz, Howard V.
Agent name :
Address for service :
Filing date :
08 August 2003
Associated companies :
Applicant name :
ILJIN DIAMOND CO., LTD.
Applicant address :
Iljin Building 50-1, Dohwa-Dong, Mapo-Gu, Seoul 121-040