Flexible circuit with electrostatic damage limiting feature

Application number :: 2003263041
Application type :: Standard
Application status :: LAPSED
Under opposition :: No
Proceeding type :
Invention title :: Flexible circuit with electrostatic damage limiting feature
Inventor :: Ee, Chee Tat ; Scheibner, John B. ; Lee, Yong Peng ; Zhang, Ke ; Dodsworth, Robert S. ; Mok, Juang Meng
Agent name :
Address for service :
Filing date :: 29 August 2003
Associated companies :
Applicant name :: 3M INNOVATIVE PROPERTIES COMPANY
Applicant address :: 3M Center, Post Office Box 33427, Saint Paul, MN 55133-3427
Old name :
Original Source :: Go

Flexible circuit with electrostatic damage limiting feature A Standard patent application filed on 29 August 2003 credited to Ee, Chee Tat ; Scheibner, John B. ; Lee, Yong Peng ; Zhang, Ke ; Dodsworth, Robert S. ; Mok, Juang Meng