Method of comparing x-ray diffraction patterns using the fundamental parameter method
A Standard patent application filed on 06 August 2003 credited to Stahly, Barbara C. ; Bugay, David E. ; Bates, Simon ; Ivanisevic, Igor ; Hallenbeck, Donald R.

Details

Application number :

2003261380  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method of comparing x-ray diffraction patterns using the fundamental parameter method  

Inventor :

Stahly, Barbara C. ; Bugay, David E. ; Bates, Simon ; Ivanisevic, Igor ; Hallenbeck, Donald R.  

Agent name :

 

Address for service :

 

Filing date :

06 August 2003  

Associated companies :

 

Applicant name :

SSCI, INC.  

Applicant address :

3065 Kent Avenue, West Lafayette, IN 47906  

Old name :

 

Original Source :

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