Integrated circuit with bit error test capability
A Standard patent application filed on 15 July 2003 credited to Heinen, Martin ; Moll, Joachim

Details

Application number :

2003255533  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Integrated circuit with bit error test capability  

Inventor :

Heinen, Martin ; Moll, Joachim  

Agent name :

 

Address for service :

 

Filing date :

15 July 2003  

Associated companies :

 

Applicant name :

AGILENT TECHNOLOGIES, INC.  

Applicant address :

395 Page Mill Road, Palo Alto 94306  

Old name :

 

Original Source :

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