Method for testing precursor of secondary cell, its testing instrument, and method for manufacturing secondary cell using the method
A Standard patent application filed on 14 August 2003 credited to Takahashi, Akira ; Igaki, Emiko ; Tanahashi, Masakazu ; Kume, Toshiro ; Shimada, Mikinari ; Imashuku, Shouichi ; Tsutsumi, Shuji ; Shoji, Masashi

Details

Application number :

2003255035  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method for testing precursor of secondary cell, its testing instrument, and method for manufacturing secondary cell using the method  

Inventor :

Takahashi, Akira ; Igaki, Emiko ; Tanahashi, Masakazu ; Kume, Toshiro ; Shimada, Mikinari ; Imashuku, Shouichi ; Tsutsumi, Shuji ; Shoji, Masashi  

Agent name :

 

Address for service :

 

Filing date :

14 August 2003  

Associated companies :

 

Applicant name :

MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.  

Applicant address :

1006, Oaza Kadoma, Kadoma-shi, Osaka 571-8501  

Old name :

 

Original Source :

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