Method for measuring thickness of an optical disc
A Standard patent application filed on 24 June 2003 credited to Seo, Hun
;
Kim, Jin Hong
;
Jeong, Seong Yun
;
Kwak, Keum Cheol
;
Kim, Jin Yong
Details
Application number :
2003244248
Application type :
Standard
Application status :
SEALED
Under opposition :
No
Proceeding type :
Invention title :
Method for measuring thickness of an optical disc
Inventor :
Seo, Hun
;
Kim, Jin Hong
;
Jeong, Seong Yun
;
Kwak, Keum Cheol
;
Kim, Jin Yong
Agent name :
Davies Collison Cave
Address for service :
1 Nicholson Street Melbourne VIC 3000 Australia
Filing date :
24 June 2003
Associated companies :
Applicant name :
LG Electronics Inc.
Applicant address :
20, Yoido-dong Youngdungpo-gu Seoul Republic of Korea