Method and system for marking a workpiece such as a semiconductor wafer and laser marker for use therein
A Standard patent application filed on 16 May 2003 credited to Nemets, Chris ; Gillespie, John R. Jr. ; Ehrmann, Jonathan S. ; Sullivan, Kevin E. ; Pelsue, Kurt ; Li, You C. ; Woelki, Michael ; Schramm, Rainer ; Cahill, Steven P. ; Leslie, Walter J. ; Pukmel, Michael

Details

Application number :

2003239502  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method and system for marking a workpiece such as a semiconductor wafer and laser marker for use therein  

Inventor :

Nemets, Chris ; Gillespie, John R. Jr. ; Ehrmann, Jonathan S. ; Sullivan, Kevin E. ; Pelsue, Kurt ; Li, You C. ; Woelki, Michael ; Schramm, Rainer ; Cahill, Steven P. ; Leslie, Walter J. ; Pukmel, Michael  

Agent name :

 

Address for service :

 

Filing date :

16 May 2003  

Associated companies :

 

Applicant name :

GSI LUMONICS CORPORATION  

Applicant address :

39 Manning Road, Billerica, MA 01821  

Old name :

 

Original Source :

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