Method and device for measuring the diffusion length of minority carriers in a semiconductor sample
A Standard patent application filed on 15 May 2003 credited to Hermes, Uwe

Details

Application number :
2003236654  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method and device for measuring the diffusion length of minority carriers in a semiconductor sample  
Inventor :
Hermes, Uwe  
Agent name :
 
Address for service :
 
Filing date :
15 May 2003  
Associated companies :
 
Applicant name :
HERMES, Uwe  
Applicant address :
2267 NW Overton St #C, Portland, OR 97210  
Old name :
 
Original Source :
Go  

Same Inventor