Analysis instrument, sample analysis method and analysis device using the instrument, and method of forming opening in the instrument
A Standard patent application filed on 28 April 2003 credited to Fujimoto, Koji ; Kitamura, Shigeru ; Hori, Masaki

Details

Application number :

2003235970  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Analysis instrument, sample analysis method and analysis device using the instrument, and method of forming opening in the instrument  

Inventor :

Fujimoto, Koji ; Kitamura, Shigeru ; Hori, Masaki  

Agent name :

 

Address for service :

 

Filing date :

28 April 2003  

Associated companies :

 

Applicant name :

ARKRAY, INC.  

Applicant address :

57, Nishiaketa-cho, Higashikujo, Minami-ku, Kyoto-shi, Kyoto 601-8045  

Old name :

 

Original Source :

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