Probe for testing a device under test

Application number :: 2003233659
Application type :: Standard
Application status :: LAPSED
Under opposition :: No
Proceeding type :
Invention title :: Probe for testing a device under test
Inventor :: Safwat, Amr M. E. ; Strid, Eric ; Dunklee, John ; Lesher, Tim ; Hayden, Leonard ; Andrews, Mike ; Martin, John
Agent name :
Address for service :
Filing date :: 23 May 2003
Associated companies :
Applicant name :: CASCADE MICROTECH, INC.
Applicant address :: 2430 N.W. 206th Street, Beaverton, OR 97006
Old name :
Original Source :: Go

Probe for testing a device under test A Standard patent application filed on 23 May 2003 credited to Safwat, Amr M. E. ; Strid, Eric ; Dunklee, John ; Lesher, Tim ; Hayden, Leonard ; Andrews, Mike ; Martin, John