Method for reducing data storage requirements for defects identified on semiconductor wafers
A Standard patent application filed on 17 April 2003 credited to Lepejian, Yervant D.

Details

Application number :

2003230998  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method for reducing data storage requirements for defects identified on semiconductor wafers  

Inventor :

Lepejian, Yervant D.  

Agent name :

 

Address for service :

 

Filing date :

17 April 2003  

Associated companies :

 

Applicant name :

HPL TECHNOLOGIES, INC.  

Applicant address :

2033 Gateway Palce, Suite 400, San Jose, CA 95110  

Old name :

 

Original Source :

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