Improvement in process control for etch processes
A Standard patent application filed on 23 April 2003 credited to Heason, David
;
Bodger, Michael D.
;
Halbrook, Mark Burton
;
Reeve, David Robert
Details
Application number :
2003228646
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Improvement in process control for etch processes
Inventor :
Heason, David
;
Bodger, Michael D.
;
Halbrook, Mark Burton
;
Reeve, David Robert