Method for determining a qualitative characteristic of an interferometric component
A Standard patent application filed on 14 March 2003 credited to Ronan, Gerard Anthony
;
Freeman, Neville John
;
Cross, Graham
Details
Application number :
2003226490
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Method for determining a qualitative characteristic of an interferometric component
Inventor :
Ronan, Gerard Anthony
;
Freeman, Neville John
;
Cross, Graham
Agent name :
Address for service :
Filing date :
14 March 2003
Associated companies :
Applicant name :
FARFIELD SENSORS LIMITED
Applicant address :
Manchester International Office Centre (MIOC), Suite 15A, Ground Floor, Styal Road, Wythenshawe, Manchester M22 5WB