High resolution scanning magnetic microscope operable at high temperature
A Standard patent application filed on 07 March 2003 credited to Xiao, Gang
;
Schrag, Benaiah D.
Details
Application number :
2003225703
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
High resolution scanning magnetic microscope operable at high temperature