Serial integrated scan-based testing of ink jet print head
A Standard patent application filed on 24 March 2003 credited to Parish, George Keith ; Edelen, John Glenn ; Cook, William Paul ; Zearfoss, Susan Marie ; Rowe, Kristi Maggard

Details

Application number :

2003218394  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Serial integrated scan-based testing of ink jet print head  

Inventor :

Parish, George Keith ; Edelen, John Glenn ; Cook, William Paul ; Zearfoss, Susan Marie ; Rowe, Kristi Maggard  

Agent name :

 

Address for service :

 

Filing date :

24 March 2003  

Associated companies :

 

Applicant name :

LEXMARK INTERNATIONAL, INC.  

Applicant address :

740 West New Circle Road, Lexington, KY 40550  

Old name :

 

Original Source :

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