Method and sampling device for detection of low levels of a property/quality trait present in an inhomogeneously distributed sample substrate
A Standard patent application filed on 25 February 2003 credited to Tseng, Ching-Hui ; Wang, Nan ; Ma, Kangming ; McFadden, Daniel

Details

Application number :

2003216405  

Application type :

Standard  

Application status :

SEALED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method and sampling device for detection of low levels of a property/quality trait present in an inhomogeneously distributed sample substrate  

Inventor :

Tseng, Ching-Hui ; Wang, Nan ; Ma, Kangming ; McFadden, Daniel  

Agent name :

Watermark Patent and Trade Marks Attorneys  

Address for service :

Level 2 302 Burwood Road Hawthorn VIC 3122 Australia  

Filing date :

25 February 2003  

Associated companies :

 

Applicant name :

Cognis IP Management GmbH  

Applicant address :

Henkelstrasse 67 40589 Dusseldorf Germany  

Old name :

Cognis Corporation  

Original Source :

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