Method and device for detecting defects, such as stains, scratches and dust, on a film in order, for example, to correct said defects while the film is being digitised
A Standard patent application filed on 05 February 2003 credited to Lavergne, Patrice
;
Delzers, Jean
Details
Application number :
2003214351
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Method and device for detecting defects, such as stains, scratches and dust, on a film in order, for example, to correct said defects while the film is being digitised
Inventor :
Lavergne, Patrice
;
Delzers, Jean
Agent name :
Address for service :
Filing date :
05 February 2003
Associated companies :
Applicant name :
KIS
Applicant address :
2110, avenue du General de Gaulle, F-38130 Echirolles, France