Method for processing multiple semiconductor devices for test
A Standard patent application filed on 26 February 2003 credited to Kovar, Gary J. ; Pham, Tim V. ; Cochran, Patrick B.

Details

Application number :

2003212469  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method for processing multiple semiconductor devices for test  

Inventor :

Kovar, Gary J. ; Pham, Tim V. ; Cochran, Patrick B.  

Agent name :

 

Address for service :

 

Filing date :

26 February 2003  

Associated companies :

 

Applicant name :

FREESCALE SEMICONDUCTOR, INC.  

Applicant address :

6501 William Cannon Drive West Austin, TX 78735 United States of America  

Old name :

 

Original Source :

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