Details

Application number :
2003212469  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method for processing multiple semiconductor devices for test  
Inventor :
Kovar, Gary J. ; Pham, Tim V. ; Cochran, Patrick B.  
Agent name :
 
Address for service :
 
Filing date :
26 February 2003  
Associated companies :
 
Applicant name :
FREESCALE SEMICONDUCTOR, INC.  
Applicant address :
6501 William Cannon Drive West Austin, TX 78735 United States of America  
Old name :
 
Original Source :
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