Method for determining the methylation pattern of dna
A Standard patent application filed on 03 February 2003 credited to Kappel, Andreas ; Muth, Jochen ; Behrensdorf, Heike

Details

Application number :

2003210200  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method for determining the methylation pattern of dna  

Inventor :

Kappel, Andreas ; Muth, Jochen ; Behrensdorf, Heike  

Agent name :

 

Address for service :

 

Filing date :

03 February 2003  

Associated companies :

 

Applicant name :

NANOGEN RECOGNOMICS GMBH  

Applicant address :

Industriepark Hochst, 65926 Frankfurt am Main  

Old name :

 

Original Source :

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