Method and device for optically testing semiconductor elements
A Standard patent application filed on 20 January 2003 credited to Gornik, Erich ; Pogany, Dionyz

Details

Application number :

2003205413  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method and device for optically testing semiconductor elements  

Inventor :

Gornik, Erich ; Pogany, Dionyz  

Agent name :

 

Address for service :

 

Filing date :

20 January 2003  

Associated companies :

 

Applicant name :

POGANY, Dionyz  

Applicant address :

Floragasse 7, A-1040 Wien  

Old name :

 

Original Source :

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