Fabrication method at micrometer- and nanometer- scales for generation and control of anisotropy of structural, electrical, optical and optoelectronic properties of thin films of conjugated materials
A Standard patent application filed on 07 October 2002 credited to Taliani, Carlo ; Mei, Paolo ; Murgia, Mauro ; Biscarini, Fabio

Details

Application number :

2002362695  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Fabrication method at micrometer- and nanometer- scales for generation and control of anisotropy of structural, electrical, optical and optoelectronic properties of thin films of conjugated materials  

Inventor :

Taliani, Carlo ; Mei, Paolo ; Murgia, Mauro ; Biscarini, Fabio  

Agent name :

 

Address for service :

 

Filing date :

07 October 2002  

Associated companies :

 

Applicant name :

CONSIGLIO NAZIONALE DELLE RICERCHE  

Applicant address :

Piazzale Aldo Moro, 7, I-00185 Roma  

Old name :

 

Original Source :

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