System and method for vision examination utilizing fault detection
A Standard patent application filed on 06 August 2002 credited to Zemon, Marc Vance ; Hu, Z. George ; Derr, Peter

Details

Application number :

2002362593  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

System and method for vision examination utilizing fault detection  

Inventor :

Zemon, Marc Vance ; Hu, Z. George ; Derr, Peter  

Agent name :

 

Address for service :

 

Filing date :

06 August 2002  

Associated companies :

 

Applicant name :

DIOPSYS, INC.  

Applicant address :

335 Main Street, Metuchen, NJ 08840  

Old name :

 

Original Source :

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