Method for high resolution patterning using soft x-ray, process for preparing nano device using the method
A Standard patent application filed on 12 September 2002 credited to Kim, Bongsoo
;
Park, Joon Won
;
La, Young-Hye
;
Kim, Ki-Jeong
;
Kang, Tai-Hee
;
Moon, Joong Ho
Details
Application number :
2002362244
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Method for high resolution patterning using soft x-ray, process for preparing nano device using the method
Inventor :
Kim, Bongsoo
;
Park, Joon Won
;
La, Young-Hye
;
Kim, Ki-Jeong
;
Kang, Tai-Hee
;
Moon, Joong Ho
Agent name :
Address for service :
Filing date :
12 September 2002
Associated companies :
Applicant name :
POSTECH FOUNDATION
Applicant address :
San 31, Hyoja-dong, Nam-gu, Pohang-city, 790-784 Kyungsangbuk-do