Conic constant measurement methods for refractive microlenses
A Standard patent application filed on 30 August 2002 credited to Kathman, Alan D. ; Suleski, Thomas J. ; Brady, Gregory ; Cruz-Cabrera, Alvaro

Details

Application number :

2002356192  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Conic constant measurement methods for refractive microlenses  

Inventor :

Kathman, Alan D. ; Suleski, Thomas J. ; Brady, Gregory ; Cruz-Cabrera, Alvaro  

Agent name :

 

Address for service :

 

Filing date :

30 August 2002  

Associated companies :

 

Applicant name :

DIGITAL OPTICS CORPORATION  

Applicant address :

9815 David Taylor Drive, Charlotte, NC 28262  

Old name :

 

Original Source :

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