Device for measuring aberrations in an eye-type system
A Standard patent application filed on 12 August 2002 credited to Levecq, Xavier Jean-Francois ; Bucourt, Samuel Henri

Details

Application number :
2002355898  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Device for measuring aberrations in an eye-type system  
Inventor :
Levecq, Xavier Jean-Francois ; Bucourt, Samuel Henri  
Agent name :
 
Address for service :
 
Filing date :
12 August 2002  
Associated companies :
 
Applicant name :
BUCOURT, Samuel, Henri  
Applicant address :
2, avenue Voltaire, F-91440 Bures sur Yvette  
Old name :
 
Original Source :
Go  

Same Inventor