Fail judging method and analyzer
A Standard patent application filed on 18 November 2002 credited to Shinno, Teppei ; Morita, Yoshimitsu ; Oura, Yoshimi

Details

Application number :
2002349656  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Fail judging method and analyzer  
Inventor :
Shinno, Teppei ; Morita, Yoshimitsu ; Oura, Yoshimi  
Agent name :
 
Address for service :
 
Filing date :
18 November 2002  
Associated companies :
 
Applicant name :
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.  
Applicant address :
1006, Oaza Kadoma, Kadoma-shi, Osaka 571-8501  
Old name :
 
Original Source :
Go  

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