Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring
A Standard patent application filed on 11 October 2002 credited to Strong, Alvin W. ; Graas, Carole ; Sullivan, Timothy D. ; Ruprecht, Michael ; Filippi, Ronald G. Jr. ; Tibel, Deborah

Details

Application number :

2002348436  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring  

Inventor :

Strong, Alvin W. ; Graas, Carole ; Sullivan, Timothy D. ; Ruprecht, Michael ; Filippi, Ronald G. Jr. ; Tibel, Deborah  

Agent name :

 

Address for service :

 

Filing date :

11 October 2002  

Associated companies :

 

Applicant name :

INFINEON TECHNOLOGIES NORTH AMERICA CORP.  

Applicant address :

1730 North First Street, San Jose, CA 95112  

Old name :

 

Original Source :

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