Details

Application number :
2002345517  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
A test handling apparatus and method  
Inventor :
Wu, Jie  
Agent name :
 
Address for service :
 
Filing date :
05 July 2002  
Associated companies :
 
Applicant name :
WU, Jie  
Applicant address :
BLK 370, Bukit Batok ST. 31, #07-205, Singapore 650370  
Old name :
 
Original Source :
Go  

Same Inventor