Method to optimize test data
A Standard patent application filed on 15 October 2002 credited to Vanderwiel, Robert W.

Details

Application number :

2002342059  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method to optimize test data  

Inventor :

Vanderwiel, Robert W.  

Agent name :

 

Address for service :

 

Filing date :

15 October 2002  

Associated companies :

 

Applicant name :

LOCKHEED MARTIN CORPORATION  

Applicant address :

6801 Rockledge Drive, Bethesda, MD 20817  

Old name :

 

Original Source :

Go