Details

Application number :
2002342059  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method to optimize test data  
Inventor :
Vanderwiel, Robert W.  
Agent name :
 
Address for service :
 
Filing date :
15 October 2002  
Associated companies :
 
Applicant name :
LOCKHEED MARTIN CORPORATION  
Applicant address :
6801 Rockledge Drive, Bethesda, MD 20817  
Old name :
 
Original Source :
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