Details

Application number :
2002338564  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Circuit and method for memory test and repair  
Inventor :
Cowles, Timothy B.  
Agent name :
 
Address for service :
 
Filing date :
11 March 2002  
Associated companies :
 
Applicant name :
MICRON TECHNOLOGY, INC.  
Applicant address :
8000 S. Federal Way, Boise, ID 83707-0006  
Old name :
 
Original Source :
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Same Inventor