Multilevel signal interface testing with binary test apparatus by emulation of multilevel signals
A Standard patent application filed on 09 September 2002 credited to Werner, Carl W.
;
Liaw, Haw-Jyh
;
Stoencypher, William F.
;
Chang, Timothy C.
;
Zerbe, Jared L.
Details
Application number :
2002333517
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Multilevel signal interface testing with binary test apparatus by emulation of multilevel signals
Inventor :
Werner, Carl W.
;
Liaw, Haw-Jyh
;
Stoencypher, William F.
;
Chang, Timothy C.
;
Zerbe, Jared L.