Method for analyzing cellular events in a sample by measuring transmitted and/or reflected electromagnetic test signals in a frequency range from 500 khz to 1000 ghz
A Standard patent application filed on 12 August 2002 credited to Hefti, John J. ; Bhagavatula, Prasanthi ; Liu, Vivian F. ; Do, Uyen T. ; Pitchford, Simon

Details

Application number :

2002331080  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method for analyzing cellular events in a sample by measuring transmitted and/or reflected electromagnetic test signals in a frequency range from 500 khz to 1000 ghz  

Inventor :

Hefti, John J. ; Bhagavatula, Prasanthi ; Liu, Vivian F. ; Do, Uyen T. ; Pitchford, Simon  

Agent name :

 

Address for service :

 

Filing date :

12 August 2002  

Associated companies :

 

Applicant name :

SIGNATURE BIOSCIENCE, INC.  

Applicant address :

475 Brannan Street, San Francisco, CA 94107  

Old name :

 

Original Source :

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