Enhanced ion beam etch selectivity of magnetic thin films using carbon-based gases
A Standard patent application filed on 12 August 2002 credited to Singleton, Eric W.
;
Minor, Michael K.
;
Seigler, Michael A.
;
Covington, Mark W.
Details
Application number :
2002323114
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Enhanced ion beam etch selectivity of magnetic thin films using carbon-based gases
Inventor :
Singleton, Eric W.
;
Minor, Michael K.
;
Seigler, Michael A.
;
Covington, Mark W.