Method for generating high-contrast images of semiconductor sites via one-photon optical beaminduced current imaging and confocal reflectance microscopy
A Standard patent application filed on 09 July 2002 credited to Saloma, Caesar A.
;
Daria, Vincent Ricardo M.
;
Miranda, Jelda Jayne C.
Details
Application number :
2002321962
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Method for generating high-contrast images of semiconductor sites via one-photon optical beaminduced current imaging and confocal reflectance microscopy
Inventor :
Saloma, Caesar A.
;
Daria, Vincent Ricardo M.
;
Miranda, Jelda Jayne C.
Agent name :
Address for service :
Filing date :
09 July 2002
Associated companies :
Applicant name :
MIRANDA, Jelda, Jayne, C.
Applicant address :
National Institute of Physics, College of Science, University of the Philippines, Diliman, Quezon City 1101