Particle analysis as a detection system for particle-enhanced assays
A Standard patent application filed on 12 July 2002 credited to Tsai, Tenlin S.
;
Xu, Renliang
Details
Application number :
2002320493
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Particle analysis as a detection system for particle-enhanced assays
Inventor :
Tsai, Tenlin S.
;
Xu, Renliang
Agent name :
Address for service :
Filing date :
12 July 2002
Associated companies :
Applicant name :
BECKMAN COULTER, INC.
Applicant address :
4300 N. Harbor Blvd., P.O. Box 3100, Fullerton, CA 92834-3100