Point diffraction interferometer using inclined-section optical fiber light source and its measuring method
A Standard patent application filed on 15 July 2002 credited to Kim, Seung-Woo ; Kim, Hag-Yong

Details

Application number :

2002319926  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Point diffraction interferometer using inclined-section optical fiber light source and its measuring method  

Inventor :

Kim, Seung-Woo ; Kim, Hag-Yong  

Agent name :

 

Address for service :

 

Filing date :

15 July 2002  

Associated companies :

 

Applicant name :

KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY  

Applicant address :

371-1, Guseong-Dong, Yuseong-Gu, Daejeon 305-701  

Old name :

 

Original Source :

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