Semiconductor test system and associated methods for wafer level acceptance testing
A Standard patent application filed on 05 April 2002 credited to Mccarty, Chris A. ; Hemmenway, Don F. ; Eisenstadt, William R. ; Chawla, Ravi ; Fox, Robert M. ; Johnston, Jeffrey M.

Details

Application number :

2002250528  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Semiconductor test system and associated methods for wafer level acceptance testing  

Inventor :

Mccarty, Chris A. ; Hemmenway, Don F. ; Eisenstadt, William R. ; Chawla, Ravi ; Fox, Robert M. ; Johnston, Jeffrey M.  

Agent name :

 

Address for service :

 

Filing date :

05 April 2002  

Associated companies :

 

Applicant name :

INTERSIL AMERICAS INC.  

Applicant address :

7585 Irvine Center Drive, Suite 100, Irvine, CA 92618  

Old name :

 

Original Source :

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