A system and method for high resolution optical imaging, data storage, lithography, and inspection
A Standard patent application filed on 07 February 2002 credited to Novotny, Lukas

Details

Application number :

2002245395  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

A system and method for high resolution optical imaging, data storage, lithography, and inspection  

Inventor :

Novotny, Lukas  

Agent name :

 

Address for service :

 

Filing date :

07 February 2002  

Associated companies :

 

Applicant name :

UNIVERSITY OF ROCHESTER  

Applicant address :

518 Hylan Building, Rochester, NY 14627  

Old name :

 

Original Source :

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