Weighted random pattern test using pre-stored weights
A Standard patent application filed on 18 December 2001 credited to Wu, David M.
;
Lin, Chih-Jen M.
Details
Application number :
2002231329
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Weighted random pattern test using pre-stored weights
Inventor :
Wu, David M.
;
Lin, Chih-Jen M.
Agent name :
Address for service :
Filing date :
18 December 2001
Associated companies :
Applicant name :
INTEL CORPORATION
Applicant address :
2200 Mission College Boulevard, Santa Clara, CA 95052