Measurement of the thickness of metals using a spectrum of electromagnetic frequencies and magnetic saturation
A Standard patent application filed on 20 November 2001 credited to Bijan, K. Amini
Details
Application number :
2002220161
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Measurement of the thickness of metals using a spectrum of electromagnetic frequencies and magnetic saturation
Inventor :
Bijan, K. Amini
Agent name :
Address for service :
Filing date :
20 November 2001
Associated companies :
Applicant name :
EM-TECH LLC
Applicant address :
Suite 650, 15832 West Hardy Road, Houston, TX 77060