Wafer area pressure control for plasma confinement
A Standard patent application filed on 26 September 2001 credited to Ellingboe, Albert R.
;
Taejoon, Han
;
Benzing, David W.
Details
Application number :
2001296916
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Wafer area pressure control for plasma confinement
Inventor :
Ellingboe, Albert R.
;
Taejoon, Han
;
Benzing, David W.