A testing device for semiconductor components and a method of using the device
A Standard patent application filed on 18 September 2001 credited to Hughes, Jeffrey S. ; Brown, Roy Russell ; Norris, Mark D.

Details

Application number :

2001289124  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

A testing device for semiconductor components and a method of using the device  

Inventor :

Hughes, Jeffrey S. ; Brown, Roy Russell ; Norris, Mark D.  

Agent name :

 

Address for service :

 

Filing date :

18 September 2001  

Associated companies :

 

Applicant name :

Motorola, Inc.  

Applicant address :

 

Old name :

 

Original Source :

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