Laplace transform impedance spectrometer and its measurement method
A Standard patent application filed on 24 December 1999 credited to Yoon, Chul-Oh
;
Kim, Jong-Hyun
;
Barsukov, Yevgen
Details
Application number :
18944
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Laplace transform impedance spectrometer and its measurement method