Fault detection method and apparatus using multiple dimension measurements
A Standard patent application filed on 07 August 2001 credited to Purdy, Matthew A. ; Markle, Richard J. ; Jenkins, Naomi M.

Details

Application number :

2001281127  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Fault detection method and apparatus using multiple dimension measurements  

Inventor :

Purdy, Matthew A. ; Markle, Richard J. ; Jenkins, Naomi M.  

Agent name :

 

Address for service :

 

Filing date :

07 August 2001  

Associated companies :

 

Applicant name :

Advanced Micro Devices Inc.  

Applicant address :

 

Old name :

 

Original Source :

Go