Detection of variations in the DNA methylation profile
A Standard patent application filed on 06 April 2001 credited to Olek, Alexander
;
Berlin, Kurt
;
Piepenbrock, Christian
Details
Application number :
2001273840
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Detection of variations in the DNA methylation profile
Inventor :
Olek, Alexander
;
Berlin, Kurt
;
Piepenbrock, Christian