Method and apparatus for measuring sample by luminescence
A Standard patent application filed on 24 December 1999 credited to Sakakibara, Tatsuya
;
Haketa, Yasushi
;
Murakami, Seiji
;
Igarashi, Toshinori
Details
Application number :
17999
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Method and apparatus for measuring sample by luminescence